The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 1998

Filed:

Nov. 21, 1996
Applicant:
Inventor:

Hideo Maeda, Yokohama, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G01B / ;
U.S. Cl.
CPC ...
359569 ; 2502 / ; 356356 ;
Abstract

An optical encoder is provided which is not affected by fluctuation of wavelength of a light beam due to temperature change, without sacrificing resolution of measurement. The optical encoder comprises a light source emitting a light beam, a first grating to which the light beam emitted by the light source is directed, and a second grating to which light beams exiting from the first grating is directed. Additionally, displacement information obtaining means is provided for obtaining information for the displacement of one of the first and second gratings, the information being obtained according to a twice-diffracted beam and a twice-transmitted beam at the second grating. The twice-diffracted beam is generated from a diffraction beam generated at the first grating, and the twice-transmitted beam is a transmission beam which has been transmitted through the first grating.


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