The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 1998
Filed:
Sep. 26, 1996
Ronald C Gamble, Altadena, CA (US);
Other;
Abstract
A scanning probe microscope is disclosed which includes a pivotally mounted scanning assembly for scanning a surface of a sample. A sensing assembly is mounted relative to the scanning assembly and is positioned for sensing the surface topography of the sample. The scanning assembly includes a bore extending vertically through the scanning assembly which allows direct overhead viewing of the sensing assembly and the sample. The scanning assembly is pivotally mounted by a hollow pivot assembly which permits both the sensing assembly and the sample to be viewed through the scanning assembly when aligning the sensing assembly with the sample. The hollow pivot assembly also allows a user to optically view the sample from directly overhead with an optical microscope or charge coupled device.