The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 1998
Filed:
Mar. 04, 1997
Armen P Sarvazyan, East Brunswick, NJ (US);
Oleg V Rudenko, Moscow, RU;
Artann Laboratories, East Brunswick, NJ (US);
Abstract
A method and devices for Shear Wave Elasticity Imaging (SWEI). The method employs a focused acoustic pulse which remotely induces a shear wave in tissue. The values of the shear modulus and dynamic shear viscosity of tissue are evaluated from the values of propagation parameters of shear acoustic waves detected by various means including Doppler ultrasound and Magnetic Resonance Imaging. Several devices for carrying out the method are described. Devices based on the method can be used as a diagnostic tool in the detection of abnormalities in tissue, such as those caused by cancer or other lesions and characterizing processes in tissues accompanied by changes in their mechanical properties. The devices can also be used for assessment of brain tissue and evaluation of the biomechanical state of muscle.