The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 1998
Filed:
Dec. 22, 1995
Andrei Csipkes, Lawrenceville, GA (US);
Muid Ur-Rehman Mufti, Atlanta, GA (US);
John Mark Palmquist, Lilburn, GA (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A surface analysis system can contactlessly, automatically, and rapidly detect, classify, and evaluate a surface of an object, particularly, an optical fiber end face, for discontinuities to derive a single pass/fail conclusion regarding the surface. The surface analysis system has a scope for capturing an image of the end face. A computer is connected to the scope. A machine vision system is associated with the computer for receiving the image. A surface analysis program is associated with the computer for driving the machine vision system. The program searches for any discontinuities in the image by analyzing each pixel and a corresponding pixel structure of pixels to determine whether a discontinuity resides at each pixel. Discontinuities are classified as one of the following: binary thresholds, local gradients, and directional gradients. The pixel structure includes a plurality of pixels that were previously analyzed. The program determines whether the surface is continuous based upon any discovered discontinuities.