The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 1998
Filed:
May. 16, 1997
Applicant:
Inventors:
Craig S Calvert, Houston, TX (US);
Vijay Khare, Sugar Land, TX (US);
Kenneth E Dahlberg, Kingwood, TX (US);
Assignee:
Exxon Production Research Company, Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ; G06F / ;
U.S. Cl.
CPC ...
367 73 ; 367 25 ; 364421 ;
Abstract
A method of geophysical prospecting using seismic trace attribute analysis for formation characterization. More particularly, a method for selection of seismic traces which most accurately represent the subsurface formation in the area of a seismic survey is disclosed. In one embodiment, inflection-point interval analysis is used to account for effects of local surfaces.
Calvert, Craig. (1998). Seismic attribute analysis using inflection point intervals (U.S. Patent No. 5808966). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5808966
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile