The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 1998
Filed:
May. 24, 1996
Hisaaki Ochi, Kodaira, JP;
Yo Taniguchi, Hachiouji, JP;
Kenichi Okajima, Hachiouji, JP;
Yoshitaka Bito, Kokubunji, JP;
Etsuji Yamamoto, Akishima, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
In the inspection system using nuclear magnetic resonance comprising magnetic field generators such as a static magnetic field, a gradient magnetic field, and an RF magnetic field, an RF probe for detecting an NMR signal from a subject, and a calculator for operating a detected signal by the RF probe, a RF probe for detection comprises a plurality of coils arranged in the predetermined direction and includes a plurality of switching elements and the inspection system selects two or more coils from the plurality of coils for each measurement of NMR signals, turns the switching elements connected to the selected coils ON, turns the switching elements connected to coils other than the selected coils OFF, changes a combination of two or more coils for each measurement of NMR signals, and changes the sensitivity distribution of the RF probe in the predetermined direction according to the Wavelet basis function for each measurement of NMR signals.