The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 1998

Filed:

Oct. 23, 1996
Applicant:
Inventors:

Cliff Leidecker, Rogue River, OR (US);

Park Squyres, Medford, OR (US);

Duncan Campbell, Central Point, OR (US);

Assignee:

SRC Vision, Inc., Medford, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C / ;
U.S. Cl.
CPC ...
2503418 ; 209577 ;
Abstract

Fruit defects of interest in the production of prunes are identified based on characteristics of illumination reflected by the fruit. Various reflection characteristics can be used in this regard including near infrared reflectivity and polarization state of the reflected illumination. In one embodiment, the apparatus (10) of the present invention includes a transport system (12) for transporting fruit (14) through an inspection zone (16), an illumination system (18) for illuminating the fruit (14), a detector system (20) for detecting reflected illumination (21), a sorting system (22) for separating defective fruit from good fruit, and a control system (24) for controlling operation of the sorting system (22) based on signals from the detector system (20) and transport system (12). The signals from the detector system can be improved by treating the fruit inorder to diminish the chlorophyll response.


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