The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 1998

Filed:

Jan. 14, 1997
Applicant:
Inventor:

Dimitrios G Cecil, Bloomfield Hills, MI (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K / ;
U.S. Cl.
CPC ...
219109 ; 198341 ;
Abstract

Control systems and methods for inspecting at least one of a plurality of parts using an inspection station are disclosed. A comparator coupled to the inspection station compares a test signal responsive to a measured parameter of a part in the inspection station to a reference signal to determine if the part matches a predetermined profile. The comparator then provides a fault signal which disables the inspection station upon determining that a part matches the predetermined profile. The profile matching part is then removed from the inspection station and stored in a storage device. The storage device then provides a confirmation signal to the comparator indicating that the profile matching part has been stored in the storage device. The comparator then enables the inspection station upon receipt of the confirmation signal. The control systems and methods of the present invention may be incorporated in a production line adapted to index at least one of the plurality of parts into and then out of the inspection station.


Find Patent Forward Citations

Cecil, Dimitrios. (1998). Quality control storage device (U.S. Patent No. 5808265). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5808265

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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