The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 1998

Filed:

Nov. 25, 1996
Applicant:
Inventor:

Nobuo Suzuki, Nukata-gun, JP;

Assignee:

Nidek Co., Ltd., Gamagori, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600558 ;
Abstract

An ophthalmic apparatus comprising an observing optical system and performing alignment through the observing optical system to position a measuring system at a predetermined position in relation to an eye to be examined comprises a detecting system for detecting whether an eyelid of the eye is within a predetermined opening condition at the time of a completion of alignment, a judging system for judging whether the opening condition of the eyelid is sufficient for measurement based on detection results detected by the open eyelid detecting means, and an informing system for informing the opening condition of the eyelid based on judgement results judged by the open eyelid condition judging means.


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