The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 1998

Filed:

Feb. 04, 1997
Applicant:
Inventor:

Hiroyuki Imataki, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B26D / ;
U.S. Cl.
CPC ...
83 13 ; 83 15 ;
Abstract

A process for manufacturing an optical recording medium having in order, a substrate, a recording film and a protective substrate and having a predetermined size, in which the protective substrate is stacked on the substrate using an adhesive layer at least outside a recording area of the recording film. The process comprises a step for cutting out an optical recording medium of a predetermined size, by using a cutting edge, from the optical recording medium of a work size, which is larger than the predetermined size. The work-sized optical recording medium comprises a substrate having the recording film on its surface, a work-sized protective substrate provided on the work-sized substrate using an adhesive layer at least in an area outside of a recording area, including an outside area of the predetermined size. The cutting step is performed in such a way that the adhesive layer, positioned at least inside a position where a cutting edge is made to enter the work-sized optical recording medium, is substantially not deformed. Thus, it is possible to provide a process of manufacturing a high-quality optical recording medium at a low cost.


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