The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 1998
Filed:
Dec. 28, 1995
Hiroshi Sato, Hitachinaka, JP;
Nobuyasu Kanekawa, Hitachi, JP;
Makoto Nohmi, Hitachinaka, JP;
Korefumi Tashiro, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An ATP device generates control data for two systems from an ATP command speed signal, provides duplicate logic units in the ATP device so as to process the respective control data, provides at least two CRC data for checking the control data for each system, and changes the CRC data of the opposite logic unit or selects one of the two according to the content of a failure detection signal from each of the duplicated logic units. It is possible to check the control data and the operation of each logic circuit in such a way that only when all the data, circuits, and elements operate normally will an output signal for controlling the object to be controlled be outputted, and when a failure is detected in a part, an output signal to that effect is outputted. Therefore, when a failure occurs, a fail safe function for performing control on the safe side is made possible.