The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 1998
Filed:
Dec. 07, 1995
Alexey V Kurbatov, Moscow, RU;
Pavel I Lazarev, Menlo Park, CA (US);
Quanta Vision, Inc., Santa Clara County, CA (US);
Abstract
A method of nondestructive investigation of the internal structure of an object uses deflected penetrating radiation. In one embodiment, an incident penetrating radiation flow 4 with angular divergence restricted by a collimator 3 passes through an object 5 to create the a radiation flow 6 registered by a direction-selective detector 10. Typically, the directivity pattern of detector 10 selects a desired angle and has a width no larger than twice the local angular divergence of the incident penetrating radiation flow 4. The desired angle can be the maxima of a scattering pattern for a substance suspected of being in object 5. To improve the quality and range of measurements, the local restrictions of radiation flow 4 is fulfilled in the two intersecting planes; and detector 10 and/or incident radiation flow 4 can be swept through a range of orientations to detect radiation deflected at a range of angles larger than the directivity pattern detector 10 has when fixed.