The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 1998

Filed:

Feb. 24, 1997
Applicant:
Inventor:

Yoshihito Fukasawa, Kanagawa-ken, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G01R / ;
U.S. Cl.
CPC ...
364579 ; 36446822 ; 36446823 ; 36446828 ; 324754 ; 324755 ; 414222 ; 414287 ;
Abstract

In a test handler for semiconductor devices according to the invention, test trays are provided with respective identification codes specific to them and the identification codes of the test trays are read by a reading device arranged respectively at given control sites in the test handler and stored in a control table and controlled by a control device along with data on the control sites for reading the identification codes of test trays and the product ICs loaded on the test trays carrying the detected identification codes. Additionally, the contents of the control table are displayed on a monitor screen and the data on the individual test trays obtained at the individual control sites and those on the product ICs are centrally controlled.


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