The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 1998
Filed:
Feb. 07, 1997
Christopher A Lacey, San Diego, CA (US);
Phase Metrics, Inc., San Diego, CA (US);
Abstract
An efficient method and apparatus for taking the data needed for a glide test; the data includes measuring flying height of a slider over a regular rotating disk and measuring piezoelectric contact with the disk. An optical system provides a beam of light. To measure the flying height, part of the beam of light is reflected from a surface of the transparent slider. Another portion of the beam is reflected from the surface of a rotating disk. The two beams are transferred through an optical system and imaged onto a CCD camera which converts the separation of intensity maxima or intensity minima into information regarding the air gap separating the slider and the disk. A piezoelectric sensor on the slider measures slider contact with the disk. A processor combines data from the piezoelectric sensor with data from the CCD camera to measure disk asperities.