The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 1998
Filed:
Apr. 08, 1996
Yeda Research and Development Co. Ltd., Rehovot, IL;
Abstract
The invention provides a method for performing interference measurements by observation of interference noise, including the steps of splitting an energy beam from an energy source into two beams directed into two different arms of an interferometer; using variable delay-generating means to introduce a path difference between the two arms; introducing a variable phase difference between the two arms, and recombining the two energy beams into a single beam. There is also provided an apparatus including a beam splitter in which an energy beam from an energy source is split into two arms, a variable delay unit in which a variable delay is imposed on one of the two arms, a constant delay unit imposing a constant delay on the other one of the two arms, and a recombiner in which the two arms are recombined to form a single output beam. A phase randomizer is interposed between the constant delay unit or the variable delay unit and the recombiner, to introduce a variable phase difference between the two arms.