The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 1998
Filed:
Nov. 29, 1996
Michel Hamelin, St-Lazare, CA;
Frank Kitzinger, Montreal, CA;
Noranda Inc., Toronto, CA;
Abstract
A magnetic testing device for obtaining a damaged index of an elongated magnetically-permeable object in real time includes a permanent magnet assembly with spaced-apart poles, a tubular pole piece adapted to surround the object, Hall effect devices placed in the magnetic flux path, a leakage flux sensor installed between the pole pieces, and a real time signal processing unit. The signal processing unit provides local fault (LF) signals generated by the leakage flux sensor, and loss of metallic area (LMA) signals generated by the Hall effect devices. The standard deviations of the LF signals are summed, the root-mean-square of the LF signals is summed, the absolute values of the LF signals are integrated, and the LMA signal is multiplied by a coefficient which is dependent on the object construction. The damage index is then determined using the thus-calculated values. Preferably, when a wire rope is passed through the monitoring device, the damage index is given to the user in a hand-held display means. Preferably, no interpretation is required by the user.