The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 1998

Filed:

Oct. 08, 1996
Applicant:
Inventors:

Dieter C Gruenert, Mill Valley, CA (US);

Austin F Dohrman, San Francisco, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ; C12P / ;
U.S. Cl.
CPC ...
435-6 ; 435 405 ; 435 912 ;
Abstract

A method and an allele-specific in situ reverse transcriptase polymerase chain reaction (RT-PCR) amplification assay for detection and differentiation between expression of unmutated wild-type DNA sequences and between endogenous mutated DNA sequences in vitro or in vivo. The method is useful for verification, diagnostic assessment and monitoring of therapeutic small fragment homologous replacement gene therapy, for diagnostic assessment and monitoring of cDNA-based gene therapies, for analysis of gene expression of specific alleles during fetal development and for diagnostic assessment of the expression of alleles involved in cancer mutations.


Find Patent Forward Citations

Gruenert, Dieter. (1998). Method and assay for detection of the expression of allele-specific (U.S. Patent No. 5804383). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5804383

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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