The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 1998

Filed:

Jun. 09, 1997
Applicant:
Inventors:

Jeffrey P Kubala, Poughquag, NY (US);

Thomas B Mathias, Vestal, NY (US);

Ira G Siegel, New Paltz, NY (US);

David E Whitney, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395551 ;
Abstract

A method and apparatus for synchronizing selected logical partitions of a partitioned information handling system to a test datesource. A system operator is presented with a display panel in which the operator may specify a set of test partitions and a test clock value. Each partition designated as a test partition is synchronized to the test clock value upon being newly activated, while production partitions are synchronized to a production clock value. The first test partition to be newly activated is synchronized to the test clock value by calculating the difference between the test clock value and a host clock value and storing the difference as an epoch offset for that partition. Each subsequently activated test partition is synchronized to the test clock value by copying the epoch offset of the previously activated test partition.


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