The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 1998

Filed:

Oct. 23, 1996
Applicant:
Inventors:

Syuji Hayashi, Osaka, JP;

Takayuki Furumoto, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
382270 ; 382274 ; 358446 ; 348673 ;
Abstract

An apparatus and a method for contrast adjustment are provided which require a reduced amount of information for the contrast adjustment. A preliminary adjustment factor is first calculated on the basis of a contrast adjustment factor, and then input image data is processed on the basis of these two adjustment factors to provide contrast-adjusted image data. For example, the inclination of a contrast adjustment line is defined by the contrast adjustment factor, and a shift amount (intercept) of the contrast adjustment line is defined by the preliminary adjustment factor which is properly determined in correspondence with the contrast adjustment factor. Thus, not only the contrast of an image but also the density of the overall image can be properly adjusted simply by specifying a single adjustment factor.


Find Patent Forward Citations

Hayashi, Syuji. (1998). Apparatus and method for contrast adjustment based on single factor (U.S. Patent No. 5802216). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5802216

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…