The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 1998

Filed:

Nov. 17, 1995
Applicant:
Inventors:

I Liang Fang, Hsinchu, TW;

Kuo Cheng Yu, Hsinchu, TW;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G11C / ; G06F / ;
U.S. Cl.
CPC ...
371 221 ; 371 225 ; 371 211 ; 39518306 ;
Abstract

An improved micro-controller with a built-in test circuit is disclosed. It contains: (a) a test-mode switching register for receiving an external instruction from a test instrument so to select a test mode and to switch the external instruction to a predetermined circuit according to a selected test mode; (b) a test control circuit electrically connected to the test-mode switching register for controlling a timing of the external instruction received from the test instrument; (c) a multiplexer electrically connected to the test control circuit to receive an output signal from the test control circuit; (d) a control circuit electrically connected to the multiplexer for receiving an output signal therefrom, wherein the control circuit decodes and executes the output signal from the multiplexer, and sends an executing result to the test instrument; (e) a test program memory electrically connected to the multiplexer for storing a built-in test program, so as to allow the micro-controller to be tested in an internal mode; (f) an application program memory for storing an application program; and (g) a ROM read-out device electrically connected to the multiplexer and the application program memory for reading program codes from the application program memory to facilitate the test instrument to make a comparison.


Find Patent Forward Citations

Loading…