The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 1998

Filed:

Apr. 05, 1996
Applicant:
Inventors:

Rich Sheu, Hsinchu, TW;

Ming-Song Wang, Hsinchu, TW;

Jung-Fu Wu, Hsinchu, TW;

Assignee:

Must System Inc., Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
364526 ; 36457101 ; 358406 ; 358504 ;
Abstract

A method and apparatus for calibrating an image system is disclosed. The method according to the present invention includes inputting data by scanning a plurality of lines into a computer, and analyzing the input data for generating intensity of the scanned lines. The inputting step is repeated when the intensity is less than a low threshold value or the intensity is higher than a high threshold value. Next, any scanned line that includes at least a special point is filtered out. After averaging the corresponding points of the scanned lines not filtered out in order to generate a calibration line, a predetermined number of points of the calibration line are averaged to generate a reference point, wherein the predetermined number of points of the calibration line are brighter than other points of the calibrated line. Finally, the calibration data are obtained by taking ratio of the reference point to each of the points of the calibration line.


Find Patent Forward Citations

Sheu, Rich. (1998). Method and apparatus for calibrating image system (U.S. Patent No. 5801962). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5801962

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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