The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1998
Filed:
Oct. 04, 1996
Applicant:
Inventors:
Peter Thoma, Rottenberg, DE;
Alf Clement, Aidlingen, DE;
Juergen Sang, Gechingen, DE;
Peter Hoffmann, Boeblingen, DE;
Robert Jahn, Jettingen, DE;
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364487 ; 36455101 ; 36470912 ; 36470915 ; 3241 / ; 356 731 ; 345145 ;
Abstract
An instrument is described for the measurement of optical and/or electrical signals, such as an optical time domain reflectometer (OTDR) or an electrical time domain reflectometer (TDR). The instrument includes a display to depict a waveform representative of measured signals, and can be operated by a few buttons, namely a start/stop button, a cursor-key and a select/confirmation-key. After adjustment of display parameters, almost the entire display is available for display of measured signals and data.