The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1998
Filed:
Feb. 23, 1995
Frederick Lanni, Pittsburgh, PA (US);
D Lansing Taylor, Pittsburgh, PA (US);
Brent Bailey, Pittsburgh, PA (US);
Carnegie Mellon University, Pittsburgh, PA (US);
Abstract
In an improved optical microscope for observing a luminescent specimen, the specimen is excited by a single, on axis or multiple superposed series of standing wave fields. Then an image of the specimen is recorded and displayed. This specimen can be incrementally moved and additional images can be recorded and processed. Images of the specimen recorded when there are nodes or antinodes at the focal plane of the microscope can be combined by image processing to produce an improved image or set of images of the specimen. Also disclosed are improved standing wave microscopes having a phase conjugator, a transmitted light source, feedback stabilization, an extended light source for field synthesis or a beam contractor. A multiple wavelength light source can be used to view a specimen marked with multiple luminescent dyes.