The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1998
Filed:
Sep. 21, 1995
Osamu Matsuda, Kanagawa, JP;
Masato Doi, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
A confocal scanning microscope can process two-dimensional or third-dimensional optical information at high speed and can be simplified in arrangement. The confocal scanning microscope includes an optical coupling device array composed of a plurality of optical coupling devices arranged on a common substrate in a one-dimensional or two-dimensional fashion, and an objective lens, wherein each of the optical coupling devices has light-emitting portion and a light-receiving portion closley disposed on the common substrate, and reflected-back light obtained from a target object after light emitted from the light-emitting portion has been reflected on the target object is received and detected near a confocal position by the light-receiving portion.