The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1998
Filed:
Feb. 08, 1996
Beno Mueller, Ettlingen, DE;
Roland Martin, Karlsruhe, DE;
Hewlett-Packard Company, , US;
Abstract
A method of measuring and compensating the effects of stray light in a spectrometer and use of the method to improve linearity and accuracy in the spectrometer. Light from a broadband light source (100) is blocked in a particular band of wavelengths by an optical filter (104) and light outside the particular band of wavelengths is transmitted by the filter. A spectral measurement within the particular band measures aggregate offset, including the effects of stray light, dark current and electronic offset. In absorption spectrometry, a first spectral measurement within the particular band is measured with a chemical sample not present and a second measurement is made with a chemical sample present. The first spectral measurement is used for compensation of a reference spectrum and the second spectral measurement is used for compensation of a sample spectrum, each within the particular band. Further compensation is made for insertion loss of a filter and stray light having wavelengths within the band of wavelengths of the particular band.