The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1998
Filed:
Aug. 05, 1996
Nobuhiko Tanaka, Hyogo, JP;
Mitsubishi Electric Semiconductor Software Co., Ltd., Hyogo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
According to the present invention, when a semiconductor device is tested, a signal for test can be set in the semiconductor device at a desired timing. A second delay circuit of the present invention has the same structure as a first delay circuit in a phase lock loop, and receives a control voltage from the phase lock loop so as to generate a clock signal with a frequency according to the control voltage and to delay and output the clock signal. A second pulse generator generates two-phase clocks by using delayed signals generated by the second delay circuit. Switches are used for switching between a system clock output terminal during an actually active time and a system clock output terminal during testing.