The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1998
Filed:
May. 29, 1997
Applicant:
Inventors:
Aline Laure Criton, Seattle, WA (US);
Thanasis Loupas, Seattle, WA (US);
Assignee:
Advanced Technology Laboratories, Inc., Bothell, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600441 ; 600455 ;
Abstract
A method and apparatus are presented for tracing the border of tissue through temporally acquired scanlines comprising the steps of reducing noise in the scanlines, producing a map of tissue edges from the scanlines, denoting a tissue border to be traced, and using velocity information corresponding to tissue edges to trace the denoted border.
Criton, Aline. (1998). Ultrasonic diagnostic imaging system with doppler assisted tracking of (U.S. Patent No. 5800356). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5800356
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile