The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 1998

Filed:

Jun. 03, 1996
Applicant:
Inventors:

Laurence P Clarke, Temple Terrace, FL (US);

Wei Qian, Wesley Chapel, FL (US);

Lihua Li, Tampa, FL (US);

Assignee:

University of South Florida, Tampa, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382132 ; 382276 ;
Abstract

A computer-assisted diagnostic (CAD) method and apparatus are described for the enhancement and detection of suspicious regions in digital X-ray images, with particular emphasis on early cancer detection using digital mammography. An objective is to improve the sensitivity of detection of suspicious areas such as masses, while maintaining a low false positive detection rate, and to classify masses as benign or malignant. A modular CAD technique has been developed as a potentially automatic and/or second-opinion method for mass detection and classification in digital mammography that may in turn be readily modified for application with different digital X-ray detectors with varying gray-scale and resolution characteristics. The method consists of using a plurality of CAD modules to preprocess and enhance image features in the gray-level, the directional texture, and the morphological domains.

Published as:

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