The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 1998
Filed:
Apr. 03, 1997
James R Ort, Kenmore, NY (US);
Douglas L Lange, Snyder, NY (US);
Frederick W Kiefer, Williamsville, NY (US);
Raymond J Dennison, West Seneca, NY (US);
Calspan Corporation, Buffalo, NY (US);
Abstract
In a method for comparing one fingerprint to another, there is recorded for each fingerprint the location and angle of minutiae along with a quality measure of each minutiae, and the core and delta location along with the local average image. An image state map defining high quality image areas with and without minutiae and areas of low image quality is also recorded. In matching fingerprints, ridge angle maps are used to align fingerprint images, then state maps are compared, followed by a comparison of minutiae locations. Fingerprints are scored according to closeness of match using a dual hypothesis technique where corresponding areas on file prints and candidate prints are provided with a positive score based when there is correspondence between good quality areas containing minutiae and good quality areas containing no minutiae, and a negative score is generated when minutiae are present in a good quality area in one fingerprint and where no minutiae are present in the corresponding good quality area in the other fingerprint.