The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 1998

Filed:

Jul. 22, 1996
Applicant:
Inventor:

Masayuki Mizusawa, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359659 ; 359368 ; 359656 ;
Abstract

A microscope objective lens is provided as a semi-apochromatic microscope objective lens whose magnification is about 20, in which the image surface is flat from the center to the periphery with favorably corrected various kinds of aberration, and which can also be used for observing fluorescence under downward radiation. The microscope objective lens comprises, successively from the object side, a negative meniscus lens component L1 having a concave surface directed onto the object side, a positive meniscus lens component L2 having a concave surface directed onto the object side, a cemented positive lens component L3, a cemented positive lens component L4, and a negative meniscus cemented lens component L5 having a concave surface directed onto the image side, wherein the following conditions:


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