The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 1998
Filed:
Apr. 10, 1996
John T Brooker, Mogadore, OH (US);
Loral Defense Systems, Akron, OH (US);
Abstract
A method and apparatus for obtaining absolute static measurement values of a physical influence includes a processor which controls the operation of a laser that generates an interferometer input signal which is submitted to an optical interferometer. The interferometer includes a coupler/splitter that splits the interferometer input signal into a reference arm and a sensing arm both of which are coupled to an appropriate physical influence. The sensing arm and the reference arm detect the status of the physical influence, whereupon the coupler/splitter generates an interferometer output signal received by the processor. The processor then correlates this interferometer output signal to an absolute static measurement value of the physical influence. A splitter is also employed to segment a portion of the interferometer input signal and employ this portion to correct the interferometer input signal and the interferometer output signal as determined by the processor. The interferometer may employ a cancellation technique to remove the inclusion of undesirable physical influences during the measurement of the desired physical influence.