The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 1998

Filed:

May. 30, 1996
Applicant:
Inventors:

Robert H Banta, Jr, Andover, MA (US);

Richard A Snyder, Chester, NH (US);

William J Ossmann, Acton, MA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73625 ; 73628 ; 73641 ;
Abstract

A composite scan pattern for ultrasound imaging includes a linear or curved linear scan pattern and one or more sector scan patterns. The sector scan patterns abut the linear or curved linear scan pattern along its boundaries to form the composite scan pattern. The linear or curved linear scan pattern can be steered to a desired angle .theta. for obtaining a high quality image. The sector apertures can be reduced in width and the linear scan pattern can be increased in width for imaging at shallow depths. The composite scan pattern provides a wide field of view for both shallow imaging and deep imaging.


Find Patent Forward Citations

Banta, Jr, Robert. (1998). Methods and apparatus for ultrasound imaging using combined scan patterns (U.S. Patent No. 5798461). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5798461

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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