The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1998
Filed:
Oct. 11, 1995
Katsuki Minamino, Tokyo, JP;
Masao Watari, Ibaragi, JP;
Miyuki Tanaka, Tokyo, JP;
Kazuo Ishii, Kanagawa, JP;
Yasuhiko Kato, Kanagawa, JP;
Hiroaki Ogawa, Tokyo, JP;
Masanori Omote, Kanagawa, JP;
Kazuo Watanabe, Tokyo, JP;
Hitoshi Honda, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
A mapping determination method for obtaining mapping F from an N-dimensional metric vector space .OMEGA..sub.N to an M-dimensional metric vector space .OMEGA..sub.M has the following steps to get the optimal mapping quickly and positively. In the first step, complete, periodic, L.sub.m basic functions g.sub.m (X) according to the distribution of samples classified into Q categories on the N-dimensional metric vector space .OMEGA..sub.N are set. In the second step, a function f.sub.m (X) indicating the m-th component of the mapping F is expressed with the linear sum of the functions g.sub.m (X) and L.sub.m coefficients c.sub.m. The third step provides Q teacher vectors T.sub.q =(t.sub.q.1, t.sub.q.2, t.sub.q.3, . . . , t.sub.q.M) (where q=1, 2, . . . , Q) for the categories on the M-dimensional metric vector space .OMEGA..sub.M, calculates the specified estimation function J, and obtains the coefficients c.sub.m which minimize the estimation function J. In the fourth step, the coefficients c.sub.m obtained in the third step are stored in memory.