The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1998
Filed:
Jul. 22, 1996
Joachim Dammig, Ingolstadt, DE;
Rieter Ingolstadt Spinnereimaschinenbau AG, Ingolstadt, DE;
Abstract
The invention relates to a process for rapid measurement of thickness or mass of a fiber sliver in a draw-frame or card (so-called 'regulation'). The object of the invention is to accelerate the process of measuring according to the state of the art while maintaining measuring precision and even improving it. For this, a process for rapid measuring of the thickness or mass of a fiber sliver in a machine processing fiber slivers, such as a draw-frame or card, in which the primary measuring signal (u.sub.1, u.sub.1 ') of the measurement indicator is taken via a signal-influencer which modifies the primary signal by segment or point before transmission in the form of measuring signal (u.sub.2, u.sub.2 '); the modification is predetermined by a characteristic line stored previously by segment or point which is based on a relationship (K1) measured by point between defined predetermined thicknesses at the measurement indicator and the primary measurement signal (u.sub.1 u.sub.1 ') measured at that moment.