The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1998
Filed:
Sep. 13, 1996
Applicant:
Inventors:
Kuoting Mike Tao, Campbell, CA (US);
Xiaohua George He, Menlo Park, CA (US);
Assignee:
Honeywell-Measurex Corporation, Cupertino, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B / ;
U.S. Cl.
CPC ...
364164 ; 364165 ; 364150 ;
Abstract
The present invention relates generally to the control of processes which include relatively long time delays, yet which are susceptible to transient external disturbances, such as high-speed sheetmaking processes. Exemplary embodiments include a control system architecture that combines internal model-based control with state feedback in a manner which provides robust control, yet provides rapid rejection of external transient disturbances even in processes including relatively long time delays.