The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1998
Filed:
Aug. 30, 1996
Applicant:
Inventors:
Roy D Allen, Burlington, MA (US);
Frank Scholten, Livingston, NJ (US);
Assignee:
Agfa Division, Bayer Corporation, Wilmington, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F / ;
U.S. Cl.
CPC ...
359305 ; 359204 ; 359211 ; 359220 ; 358493 ;
Abstract
A multi-beam scanning system for scanning a curved imaging surface includes at least one radiation emitter configured to emit a first beam of radiation and a second beam of radiation. A spin deflector, rotatable about a spin axis, directs the first beam to form a first scan line and the second beam to form a second scan line on the imaging surface. At least one acousto-optic element, disposed in the path of at least one of the beams and upstream of the spin deflector, is operable to deflect the at least one beam with respect to the spin axis of the spin deflector.