The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 1998

Filed:

Nov. 22, 1996
Applicant:
Inventor:

Tatsuo Igushi, Miyanohigashi-machi, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356336 ; 250574 ;
Abstract

Particle size distribution measuring equipment includes a flow cell that can be illuminated with light so that suspended particles can scatter the light and thereby measure both particle size and frequency. A dispenser unit is connected to the flow cell for delivering a sample. A fractionator unit can pretreat the sample to provide particles over a predetermined size in a sealed chamber resulting from the impact of compressed air. The fractionated sample can be delivered to the dispenser, and a controller can automatically coordinate the preparation of the dispenser unit, the flow cell, the measuring of scattered light, and the release of the fractionated sample from the sealed chamber.


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