The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1998
Filed:
Mar. 27, 1997
Dennis Derickson, Windsor, CA (US);
Roger Lee Jungerman, Petaluma, CA (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A detector array spectrometer simultaneously monitors wavelength, power, and signal-to-noise ratio of wavelength division multiplexed (WDM) channels in telecommunication networks. A spectrometer spatially separates signals from the WDM channels according to the channels' wavelengths. The separated signals are incident on an array of split-detectors that conforms to the spatial separation of the signals provided by the spectrometer. While the split-detectors are positioned to receive a signal from each WDM channel, a noise detector is positioned between adjacent split-detectors to measure noise. A common mode output from two halves of each split-detector indicates the power in a WDM channel, while a differential output from the halves indicates wavelength deviations in the WDM channels. The ratio of the common mode signal to the noise detector signal is used to monitor the signal-to-noise ratio of the WDM channel. An angled diffraction grating in the spectrometer achieves compact size and high measurement resolution for the detector array spectrometer.