The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1998
Filed:
Feb. 27, 1997
Malvin Carl Teich, Boston, MA (US);
Bahaa E Saleh, Lexington, MA (US);
Trustees of Boston University, Boston, MA (US);
Abstract
The present invention relates to novel entangled-photon microscopy, spectroscopy and display systems. The systems include a source of light in the form of twin or multiple entangled-photon beams. The systems also include optical components that direct the twin or multiple entangled-photon beams towards a target material. The target material includes emission or indicator means responsive to an energy, which approximately equals the sum of the energies of the entangled photons. The systems may further include imaging means that is sensitive to the response of the target material. The present invention also relates to novel correlated-photon microscopy, spectroscopy and display systems. The present invention further relates to methods of correlated-photon microscopy in which a pump beam of photons is provided. A portion of the pump beam is split into a first beam and a second beam, the beams having corresponding correlated photons. The beams are directed towards a target material, thereby allowing the absorption of correlated-photon pairs at selected and adjustable points in the target material. The target material then emits luminescence or causes an effect, which may be captured by an imaging means.