The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1998
Filed:
Feb. 29, 1996
Nicholas Sporck, Saratoga, CA (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
A semiconductor device is provided having a circuit for measuring a propagation delay related to metal layers formed on the device. In one embodiment, the circuit includes a first bond pad connected to an input of a first signal path, the first signal path including a first plurality of serially connected logic gates wherein the connection between each logic gate of the first plurality is formed on a first metal layer and a second bond pad connected to an output of a second signal path, the second signal path including a second plurality of serially connected logic gates wherein the connection between each logic gate of the second plurality is formed on a second metal layer, the second signal path being in electrical communication with the first signal path.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile