The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1998
Filed:
Sep. 19, 1996
David C Arnquist, The Colony, TX (US);
Grady Barnes, III, Grayslake, IL (US);
Chadwick M Dunn, McHenry, IL (US);
Richard C East, Jr, Dallas, TX (US);
Patrick P Fritchie, Southlake, TX (US);
Gregory E Gardner, Euless, TX (US);
Cass J Grandone, Southlake, TX (US);
Robert C Gray, Gurnee, IL (US);
James T Holen, Mundelein, IL (US);
Jimmy D McCoy, Keller, TX (US);
James E Mitchell, Windham, NH (US);
Adrian John Murray, Arlington Heights, IL (US);
David W Murray, Allen, TX (US);
Jack F Ramsey, Grayslake, IL (US);
Neal T Sleszynski, Kenosha, WI (US);
Abbott Laboratories, Abbott Park, IL (US);
Abstract
Embodiments described herein provide methods of performing a process for determining an item of interest in a sample. In one embodiment, a container for holding the sample is accepted in a process lane where a process step is selectively automatically performed on the sample in the container. The process step is selectively automatically performed on the sample in the container. An effective length of the process lane is maintained constant while a physical length of the process lane is selectively varied.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile