The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 1998

Filed:

Feb. 20, 1997
Applicant:
Inventors:

Sayan Pathak, Seattle, WA (US);

Vikram Chalana, Mountlake Terrace, WA (US);

Yongmin Kim, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A60B / ;
U.S. Cl.
CPC ...
600443 ; 600449 ;
Abstract

An ultrasound system automatically measures fetal head size from ultrasound images. An ultrasound image of the fetal head is detected. A radial maxima point is identified on each of a plurality of radii extending from a substantially common vertex point within the fetal head image. Each radial maxima point corresponds to an ultrasound sample along its corresponding radius, and has a maximum ultrasound echo strength. Outlier points are removed and the curve filtered to derive an initial fetal head boundary. An inner fetal head boundary and outer fetal head boundary are derived from the initial fetal head boundary and a predetermined fetal skull thickness, and fetal head size is computed from the inner fetal head boundary and the outer fetal head boundary. Processing is allocated among multiprocessors and performed in pipeline fashion to enable real-time interactive imaging and measuring.


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