The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 1998

Filed:

Dec. 04, 1995
Applicant:
Inventors:

Jennifer B Pencis, Austin, TX (US);

Atish Ghosh, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39518203 ; 371 211 ; 39518204 ;
Abstract

A primary cache test system is supplied using a secondary cache that closely matches specifications of the primary cache. Coherency is maintained between the primary and secondary caches using inclusion by a write-once protocol. The test system includes software which suspends cache operations on receipt of an error signal from a secondary cache controller or by periodically pausing cache operations for cache operation monitoring. During suspension of cache operations, the software verifies the states of the primary cache against the states and data within the secondary cache. Signals on cache hit and hit-modified pins that are available on the microprocessor integrated circuit are monitored to detect various error conditions. Error analysis includes detection of invalid hits to the primary cache, incorrectly modified lines in the primary cache and misses to the primary cache that should be hits.


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