The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 1998
Filed:
Dec. 06, 1995
Applicant:
Inventors:
Todd E Clapp, St. Paul, MN (US);
Kenneth I Wolfe, Jr, Maplewood, MN (US);
Mark R Drutowski, St. Paul, MN (US);
Assignee:
Minnesota Mining and Manufacturing Company, St. Paul, MN (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382318 ; 382112 ;
Abstract
A zoned inspection system and method produce inspection results consistent with a user's view of an article by transforming parallel, temporal inspection results from multiple detectors into a serial, spatial domain.
Clapp, Todd. (1998). Zoned inspection system and method for presenting temporal (U.S. Patent No. 5793904). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5793904
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile