The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 1998

Filed:

Jan. 31, 1996
Applicant:
Inventor:

John Endriz, Belmont, CA (US);

Assignee:

SDL, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S / ;
U.S. Cl.
CPC ...
372 31 ; 372 50 ;
Abstract

A method of producing a high power and brightness beam from diode laser source that either has a single emitting element or array with a plurality of segments or emitters that are concurrently addressable, or has a plurality of elements or subarrays each having a plurality of laser segments or emitters, which elements or subarrays are independently addressable relative to one another. Beam filling and focusing optics are disposed in front of the emitters so that light from the individual emitters from each subarray converge to from a single overlapping spot. Segmentation of laser subarrays and emitters improves laser life by reducing thermal gradients and isolating any local failures to a single segment emitters, while the focusing of the segments or emitters to overlapping light spots increases the tolerance of the source to local failures. Two or more emitters in a given element must fail before the source is considered to have failed.


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