The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 1998
Filed:
Dec. 21, 1995
John Youssef Sayah, North Tarrytown, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus for detecting valid placement of library cells on chip images or hierarchy design images may be accomplished by determining a periodic pattern of the chip image, or hierarchical image. Once the repetitive pattern is recognized, this pattern is represented by a binary vector. Similarly, a binary vector is created for a particular cell library that is to be placed on the chip image or hierarchical design image. When the placement algorithm places the library cell on the chip or hierarchical image, the binary vector of the library cell is folded over a folded binary vector of the chip image or hierarchical design image to produce a component delta set. In essence, the component delta set indicates spacing violations between the library cell and the chip or hierarchical design image. When such a spacing violation is recognized, the placement algorithm can immediately reposition the library cell.