The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 1998
Filed:
Jan. 18, 1996
Carsten Feiertag, Hungen, DE;
Rainer Kirchhubel, Asslar, DE;
Oculus Optikgeraete GmbH, Wetzlar-Dutenhofen, DE;
Abstract
Sight testing apparatus, in particular sight testing apparatus with a free through-view, for examining near-sightedness and far-sightedness and color and stereoscopic vision, can operate with test objects which are located within the focal length of an imaging device and are imaged at different distances into the eye, located at the focus of the imaging device, of a subject under test. For this purpose, the size of the image must be able to be altered. For this purpose, an optical full deflection device is provided in the beam path between the image device and the test object, deflects the beam path through 180.degree. and is constructed so as to be displaceable.