The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 1998
Filed:
Sep. 25, 1995
James G Hagerman, San Diego, CA (US);
Hughes-JVC Technology Corporation, Carlsbad, CA (US);
Abstract
A system for measuring the illumination uniformity of a liquid light value (LCLV) for a LCLV projector includes a projection device including a first LCLV. The projection device reflects light from the first LCLV to form an image on a screen. An image sensing device senses illumination values for a plurality portions of said image. A processor is coupled to the image sensing device and the projection device. The processor determines an optimum voltage bias which provides a maximum illumination for the plurality of image pixels. The illumination uniformity measuring system can independently measure the illumination non-uniformity of the LCLV and illumination non-uniformity resulting from other sources such as projection lens roll-off, screen gain, and other illumination non-uniformities. Using the measured illumination non-uniformity, a correction system can improve the quality of the displayed image.