The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 1998
Filed:
Dec. 05, 1995
Eriko Takeda, Tokyo, JP;
Toshikazu Nishino, Kawasaki, JP;
Masahiro Otaka, Hitachi, JP;
Ren Morinaka, Hitachi, JP;
Fuminobu Takahashi, Hitachinaka, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A measurement system for measuring material deterioration in accordance with a magnetic field of the material in the presence of radiation. The measurement system includes a detection circuit which detects a magnetic field of the material and generates a signal indicative thereof which signal includes noise due to the radiation, a signal processing circuit including semiconductor devices to process the signal generated from the detection circuit and a noise reducing circuit for at least reducing noise in the generated signal which is due to the radiation. The signal processing circuit is installed at a place where a dose equivalent of radiation is equal to or smaller than that of a place where the detection circuit is installed.