The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 1998

Filed:

Feb. 07, 1997
Applicant:
Inventors:

Chie-Ching Lin, Taichung, TW;

Kuang-Lung Tsai, Hsinchu, TW;

Lyuji Ozawa, Hopewell Junction, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B05D / ;
U.S. Cl.
CPC ...
427 64 ; 427431 ; 4274432 ;
Abstract

Improved luminous efficiency in plasma displays has been achieved by coating phosphor particles with a dielectric layer having a refractive index, for the ultraviolet light emitted by the plasma, that is intermediate between that of the phosphor and vacuum. When deposited in a thickness range between 0.5 and 5 microns, the layer causes the particle's reflectivity to be reduced because of reduced reflection at the vacuum-coating interface as well as internal reflection at the coating-vacuum interface. For coating thicknesses in the range of 0.1 to 0.5 microns, reflectivity is reduced because of interference between rays reflected at the vacuum-coating interface and the coating-phosphor interface. Several methods for forming these antireflection coatings are described. These include CVD, PVD, and suspension in molten dielectric followed by decanting onto either sticky or non-stick surfaces.


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